On 11 May 2025, the Ministry of Industry and Information Technology (MIIT) closes its public consultation on the 78 proposed national standards. These include standards related to semiconductor mechanical and climatic testing methods, such as the Accelerated Moisture Resistance – Unbiased Highly Accelerated Stress Test (Standard 20141817-T-339), Temperature Cycling (Standard 20141818-T-339), and the Board Level Drop Test Method Using Accelerometers (Standard 20204846-T-339). The consultation also covers standards concerning semiconductor sensors, materials, storage, electromagnetic compatibility, and modelling. Furthermore, it includes drafts on the Digital Supply Chain System Architecture (Standard 20221956-T-339) and General Security Requirements for Digital Supply Chains (Standard 20221955-T-339). The process is intended to collect input from a range of stakeholders prior to the final approval and publication of the standards.
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